投稿咨詢
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.
《Microelectronics Reliability》是一本由PERGAMON-ELSEVIER SCIENCE LTD出版商出版的專業工程技術期刊，該刊創刊于1964年，刊期Monthly，該刊已被國際權威數據庫SCI、SCIE收錄。在中科院最新升級版分區表中，該刊分區信息為大類學科：工程技術 4區，小類學科：工程：電子與電氣 4區；納米科技 4區；物理：應用 4區；在JCR（Journal Citation Reports）分區等級為Q4。該刊發文范圍涵蓋工程：電子與電氣等領域，旨在及時、準確、全面地報道國內外工程：電子與電氣工作者在該領域取得的最新研究成果、工作進展及學術動態、技術革新等，促進學術交流，鼓勵學術創新。2021年影響因子為1.418，平均審稿速度較快,2-4周。
| 大類學科 | 分區 | 小類學科 | 分區 | Top期刊 | 綜述期刊 |
| 工程技術 | 4區 | ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣 NANOSCIENCE & NANOTECHNOLOGY 納米科技 PHYSICS, APPLIED 物理：應用 | 4區 4區 4區 | 否 | 否 |
| JCR分區等級 | JCR所屬學科 | 分區 | 影響因子 |
| Q4 | NANOSCIENCE & NANOTECHNOLOGY | Q4 | 1.418 |
| PHYSICS, APPLIED | Q4 | ||
| ENGINEERING, ELECTRICAL & ELECTRONIC | Q4 |
| 影響因子 | h-index | Gold OA文章占比 | 研究類文章占比 | OA開放訪問 | 平均審稿速度 |
| 1.418 | 80 | 4.53% | 98.03% | 未開放 | 較快,2-4周 |
課題、SCI/EI/SSCI怎么寫？